Phase-field study on the segregation mechanism of Cr to lamellar interface in C40-NbSi2/C11b-MoSi2 duplex silicide

Toshihiro Yamazaki, Yuichiro Koizumi, Akihiko Chiba +5

Cr-segregation to a lamellar interface in NbSi2/MoSi2 duplex silicide has been examined by a newly developed phase-field model. The model can take into account the segregation ener…