62 citations · 483 across the 28 of their papers we have counts for
3 papers · 1 filter
Structural Analysis of Si(OEt)4 Deposits on Au(111)/SiO2 Substrates at Nanometer Scale using Focused Electron Beam Induced Deposition
Po-Shi Yuan, Nigel Mason, Maria Pintea +2
The focused electron beam induced deposition (FEBID) process was used by employing a Gemini SEM with a beam characteristic of 1keV and 24pA for the deposition of pillars and line s…
Dissociative Electron Attachment Cross Sections for Ni(CO)4, Co(CO)3NO, Cr(CO)6
Maria Pintea, Nigel Mason, Maria Tudorovskaya
The Ni(CO)4, Cr(CO)6, Co(CO)3NO are some of the most common precursors used for the focused electron-induced deposition. Some of the compounds, even though extensively used have hi…
Velocity Map Imaging and Cross Sections of Fe(CO)5 for FEBIP Applications
Maria Pintea, Nigel Mason, Maria Tudorovskaya
The present paper intends to be a new study of a widely used precursor in nanostructure deposition and FEBID processes with a focus on its fragmentation at collisions with low-ener…