41 citations · 63 across the 5 of their papers we have counts for
5 papers
Instrument for in situ hard x-ray nanobeam characterization during epitaxial crystallization and materials transformations
Samuel D. Marks, Peiyu Quan, Rui Liu +5
Solid-phase epitaxy (SPE) and other three-dimensional epitaxial crystallization processes pose challenging structural and chemical characterization problems. The concentration of d…
Optical and structural properties of Si doped -GaO (010) thin films homoepitaxially grown by halide vapor phase epitaxy
Bahadir Kucukgok, David J. Mandia, Jacob H. Leach +6
We report the optical, electrical, and structural properties of Si doped -GaO films grown on (010)-oriented -GaO substrate via HVPE. Our results show that, de…
Persistence of Island Arrangements During Layer-by-Layer Growth Revealed Using Coherent X-rays
Guangxu Ju, Dongwei Xu, Matthew J. Highland +7
Understanding surface dynamics during epitaxial film growth is key to growing high quality materials with controllable properties. X-ray photon correlation spectroscopy (XPCS) usin…
Characterization of the X-ray Coherence Properties of an Undulator Beamline at the Advanced Photon Source
Guangxu Ju, Matthew J. Highland, Carol Thompson +5
In anticipation of the increased use of coherent x-ray methods and the need to upgrade beamlines to match improved source quality, we have characterized the coherence properties of…
An instrument for advanced in situ x-ray studies of metal-organic vapor phase epitaxy of III-nitrides
Guangxu Ju, Matthew J. Highland, Angel Yanguas-Gil +6
We describe an instrument that exploits the ongoing revolution in synchrotron sources, optics, and detectors to enable in situ studies of metal-organic vapor phase epitaxy (MOVPE)…