Long Term Logarithmic Annealing in p-MNOS RADFETs and Renormalization of Relaxation Parameters

G. I. Zebrev, P. A. Zimin, E. V. Mrozovskaya +3

It was experimentally shown that annealing (fading) of the pMNOS based dosimeters has close to logarithmic temporal dependence during and after irradiation. The results are shown t…