Dimensionality dependent electronic structure of the exfoliated van der Waals antiferromagnet NiPS${}_3$

M. F. DiScala, D. Staros, A. de la Torre +6

Resonant Inelastic X-ray Scattering (RIXS) was used to measure the local electronic structure in few-layer exfoliated flakes of the van der Waals antiferromagnet NiPS${}_3$. The resu…