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20182022
most citedUsing binary decision diagrams for constraint handling in combinatorial interaction testing

3 citations · 8 across the 6 of their papers we have counts for

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6 papers · 1 filter

cs.SE2022★ 2 cited

Embedded System Evolution in IoT System Development Based on MAPE-K Loop Mechanism

Hiroyuki Nakagawa, Shinya Tsuchida, Emiliano Tramontana +2

Embedded systems including IoT devices are designed for specialized functions; thus, changes in functions are not considered following their release. For this reason, changing func…

cs.SE2021

Constrained Detecting Arrays: Mathematical Structures for Fault Identification in Combinatorial Interaction Testing

Hao Jin, Ce Shi, Tatsuhiro Tsuchiya

Context: Detecting arrays are mathematical structures aimed at fault identification in combinatorial interaction testing. However, they cannot be directly applied to systems that h…

cs.SE2019★ 1 cited

Using simulated annealing for locating array construction

Tatsuya Konishi, Hideharu Kojima, Hiroyuki Nakagawa +1

Context: Combinatorial interaction testing is known to be an efficient testing strategy for computing and information systems. Locating arrays are mathematical objects that are use…

cs.SE2019★ 3 cited

Using binary decision diagrams for constraint handling in combinatorial interaction testing

Tatsuhiro Tsuchiya

Constraints among test parameters often have substantial effects on the performance of test case generation for combinatorial interaction testing. This paper investigates the effec…

cs.SE2019★ 1 cited

Finding minimum locating arrays using a CSP solver

Tatsuya Konishi, Hideharu Kojima, Hiroyuki Nakagawa +1

Combinatorial interaction testing is an efficient software testing strategy. If all interactions among test parameters or factors needed to be covered, the size of a required test…

cs.SE2018

Constrained locating arrays for combinatorial interaction testing

Hao Jin, Tatsuhiro Tsuchiya

This paper introduces the notion of Constrained Locating Arrays (CLAs), mathematical objects which can be used for fault localization in software testing. CLAs extend ordinary loca…