most citedVoid region segmentation in ball grid array using u-net approach and synthetic data

1 citations · 1 across the 1 of their papers we have counts for

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2 papers

eess.IV2019

Robust BGA Void Detection Using Multi Directional Scan Algorithms

Vikas Ahuja, Vijay Kumar Neeluru

The life time of electronic circuits board are impacted by the voids present in soldering balls. The quality inspection of solder balls by detecting and measuring the void is impor…

eess.IV2019★ 1 cited

Void region segmentation in ball grid array using u-net approach and synthetic data

Vijay Kumar Neeluru, Vikas Ahuja

The quality inspection of solder balls by detecting and measuring the void is important to improve the board yield issues in electronic circuits. In general, the inspection is carr…