activity
20192021
most citedCNFET-based design of efficient ternary half adder and 1-trit multiplier circuits using dynamic logic

31 citations · 53 across the 6 of their papers we have counts for

collaborators

6 papers

cs.ET202131 cited

CNFET-based design of efficient ternary half adder and 1-trit multiplier circuits using dynamic logic

Farzin Mahboob-Sardroudi, Mehdi Habibi, Mohammad-Hossein Moaiyeri

This paper presents a ternary half adder and a 1-trit multiplier using carbon nanotube transistors. The proposed circuits are designed using pass transistor logic and dynamic logic…

eess.SP2021

A signed pulse-train based image processor-array for parallel kernel convolution in vision sensors

Ahmad Reza Danesh, Mehdi Habibi

Purpose- High speed image processing is a challenging task for real-time applications such as product quality control of manufacturing lines. Smart image sensors use an array of in…

physics.ins-det20213 cited

Nanopore-Based DNA Sequencing Sensors and CMOS Readout Approaches

Mehdi Habibi, Yunus Dawji, Ebrahim Ghafar-Zadeh +1

Purpose Nanopore-based molecular sensing and measurement, specifically Deoxyribonucleic acid (DNA) sequencing, is advancing at a fast pace. Some embodiments have matured from coars…

eess.SP202119 cited

A 0.4 V, 19 pW Subthreshold Voltage Reference Generator Using Separate Line Sensitivity and Temperature Coefficient Correction Stages

Mohammad Azimi, Mehdi Habibi, Hamid-Reza Karimi-Alavijeh

Sensor nodes and IoT systems require blocks that not only consume low power but also have good accuracy. Voltage reference generators are also considered important building blocks…

eess.SP2020

Transmit Power Optimization in Optical Coherent Transmission Systems: Analytical, Simulation, and Experimental Results

Ramin Hashemi, Mehdi Habibi, Hamzeh Beyranvand +3

In this paper, we propose to use the discretized version of the so-called Enhanced Gaussian Noise (EGN) model to estimate the non-linearity effects of fiber on the performance of o…

cs.AR2019

A Range Matching CAM for Hierarchical Defect Tolerance Technique in NRAM Structures

Hossein Pourmeidani, Mehdi Habibi

Due to the small size of nanoscale devices, they are highly prone to process disturbances which results in manufacturing defects. Some of the defects are randomly distributed throu…