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20182020
most citedDC Electrical Degradation of YSZ: Voltage Controlled Electrical Metallization of A Fast Ion Conducting Insulator

3 citations · 3 across the 2 of their papers we have counts for

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cond-mat.mtrl-sci2019★ 3 cited

DC Electrical Degradation of YSZ: Voltage Controlled Electrical Metallization of A Fast Ion Conducting Insulator

Ana Alvarez, Yanhao Dong, I-Wei Chen

DC electrical degradation as a form of dielectric and resistance breakdown is a common phenomenon in thin-film devices including resistance-switching memory. To obtain design data…