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cond-mat.mtrl-sci2004
Observation of Buried Phosphorus Dopants near Clean Si(100)-(2x1) with Scanning Tunneling Microscopy
Geoffrey W. Brown, Holger Grube, Marilyn E. Hawley
We have used scanning tunneling microscopy to identify individual phosphorus dopant atoms near the clean silicon (100)-(2x1) reconstructed surface. The charge-induced band bending…
cond-mat.mtrl-sci2003★ 28 cited
Split-off dimer defects on the Si(001)2x1 surface
S. R. Schofield, N. A. Marks, N. J. Curson +6
Dimer vacancy (DV) defect complexes in the Si(001)2x1 surface were investigated using high-resolution scanning tunneling microscopy and first principles calculations. We find that…