14 citations · 29 across the 7 of their papers we have counts for
7 papers
Robust Device-Independent Certification of Boolean-Phase Gates
Yunguang Han, Xingyuan Bu, Aleksandra Gočanin +1
Device-independent certification of a quantum gate requires the input and output tests to identify the same reference qubits. Self-testing the output Choi state alone does not guar…
Device-Independent Self-Testing of the Three-Qubit CCZ Hypergraph State
Yunguang Han, Xin Kuang, Xingyuan Bu +1
The three-qubit CCZ state is the smallest rank-three hypergraph state and an elementary entangled magic resource. Its cubic phase is governed by generalized stabilizers that are no…
Quantifying the intrinsic randomness in sequential measurements
Xinjian Liu, Yukun Wang, Yunguang Han +1
In the standard Bell scenario, when making a local projective measurement on each system component, the amount of randomness generated is restricted. However, this limitation can b…
Self-testing of different entanglement resources via fixed measurement settings
Xinhui Li, Yukun Wang, Yunguang Han +1
Self-testing, which refers to device independent characterization of the state and the measurement, enables the security of quantum information processing task certified independen…
Robust one-sided self-testing of two-qubit states via quantum steering
Yukun Wang, Xinjian Liu, Shaoxuan Wang +2
Entangled two-qubit states are the core building blocks for constructing quantum communication networks. Their accurate verification is crucial to the functioning of the networks,…
Self-testing of symmetric three-qubit states
Xinhui Li, Yukun Wang, Yunguang Han +2
Self-testing refers to a device-independent way to uniquely identify the state and the measurement for uncharacterized quantum devices. The only information required comprises the…
Self-testing using only marginal information
Xinhui Li, Yu Cai, Yunguang Han +2
The partial states of a multipartite quantum state may carry a lot of information: in some cases, they determine the global state uniquely. This result is known for tomographic inf…