46 citations · 67 across the 23 of their papers we have counts for
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SenseAI: Real-Time Inpainting for Electron Microscopy
Jack Wells, Amirafshar Moshtaghpour, Daniel Nicholls +4
Despite their proven success and broad applicability to Electron Microscopy (EM) data, joint dictionary-learning and sparse-coding based inpainting algorithms have so far remained…
The Potential of Subsampling and Inpainting for Fast Low-Dose Cryo FIB-SEM Imaging and Tomography
Daniel Nicholls, Maryna Kobylysnka, Jack Wells +7
Traditional image acquisition for cryo focused ion-beam scanning electron microscopy tomography often sees thousands of images being captured over a period of many hours, with imme…
Simultaneous High-Speed and Low-Dose 4-D STEM Using Compressive Sensing Techniques
Alex W. Robinson, Amirafshar Moshtaghpour, Jack Wells +5
Here we show that compressive sensing allow 4-dimensional (4-D) STEM data to be obtained and accurately reconstructed with both high-speed and low fluence. The methodology needed t…
Proceedings of the first edition of the International Symposium on Computational Sensing (ISCS23)
Thomas Feuillen, Amirafshar Moshtaghpour
The International Symposium on Computational Sensing (ISCS) brings together researchers from optical microscopy, electron microscopy, RADAR, astronomical imaging, biomedical imagin…
Subsampling Methods for Fast Electron Backscattered Diffraction Analysis
Zoë Broad, Daniel Nicholls, Jack Wells +5
Despite advancements in electron backscatter diffraction (EBSD) detector speeds, the acquisition rates of 4-Dimensional (4D) EBSD data, i.e., a collection of 2-dimensional (2D) dif…
Scan Coil Dynamics Simulation for Subsampled Scanning Transmission Electron Microscopy
Daniel Nicholls, Jack Wells, Alex W. Robinson +3
Subsampling and fast scanning in the scanning transmission electron microscope is problematic due to scan coil hysteresis - the mismatch between the actual and assumed location of…
In silico Ptychography of Lithium-ion Cathode Materials from Subsampled 4-D STEM Data
Alex W. Robinson, Amirafshar Moshtaghpour, Jack Wells +5
High quality scanning transmission electron microscopy (STEM) data acquisition and analysis has become increasingly important due to the commercial demand for investigating the pro…