Dynamic Multi-Criteria Bottleneck Severity Index (DMBSI) for Semiconductor Wafer Manufacturing: A Genetically Optimised Framework for Reentrant Production Systems

Mohammad Sharifur Rahman, Karl McCreadie, Saugat Bhattacharyya +5

Wafer fabrication exhibits unique characteristics, including reentrant process flows, variable bottlenecks, and highly variable process conditions. In order to identify the most se…