109 citations · 372 across the 21 of their papers we have counts for
23 papers
Experiments at the CERN SPS: first signals of deconfinement
Federico Antinori, Marek Gazdzicki, Tapan K. Nayak +6
Heavy-ion experiments at the CERN SPS began in the mid-1980s to study nuclear matter at extreme temperatures and densities. The program started with light ions, such as oxygen and…
Influence of Radiation and AC Coupling on Time Performance of Analog Pixels Test Structures in 65 nm CMOS technology
Gianluca Aglieri Rinella, Luca Aglietta, Matias Antonelli +44
Monolithic Active Pixel Sensors (MAPS) in advanced CMOS imaging technologies are key to next-generation tracking systems for high-energy physics, where radiation hardness and preci…
Characterisation of the first wafer-scale prototype for the ALICE ITS3 upgrade: the monolithic stitched sensor (MOSS)
Omar Abdelrahman, Gianluca Aglieri Rinella, Luca Aglietta +136
This paper presents the characterisation and testing of the first wafer-scale monolithic stitched sensor (MOSS) prototype developed for the ALICE ITS3 upgrade that is to be install…
Further Characterisation of Digital Pixel Test Structures Implemented in a 65 nm CMOS Process
Gianluca Aglieri Rinella, Nicole Apadula, Anton Andronic +55
The next generation of MAPS for future tracking detectors will have to meet stringent requirements placed on them. One such detector is the ALICE ITS3 that aims to be very light at…
Detection efficiency and spatial resolution of Monolithic Active Pixel Sensors bent to different radii
Anton Andronic, Pascal Becht, Mihail Bogdan Blidaru +37
Bent monolithic active pixel sensors are the basis for the planned fully cylindrical ultra low material budget tracking detector ITS3 of the ALICE experiment. This paper presents r…
Characterisation of analogue Monolithic Active Pixel Sensor test structures implemented in a 65 nm CMOS imaging process
Gianluca Aglieri Rinella, Giacomo Alocco, Matias Antonelli +91
Analogue test structures were fabricated using the Tower Partners Semiconductor Co. CMOS 65 nm ISC process. The purpose was to characterise and qualify this process and to optimise…