activity
20212024
most citedSIM-STEM Lab: Incorporating Compressed Sensing Theory for Fast STEM Simulation

11 citations · 15 across the 9 of their papers we have counts for

collaborators

9 papers

physics.app-ph20241 cited

LoRePIE: Regularised Extended Ptychographical Iterative Engine for Low-dose and Fast Electron Ptychography

Amirafshar Moshtaghpour, Abner Velazco-Torrejon, Alex W. Robinson +2

The extended Ptychographical Iterative Engine (ePIE) is a widely used phase retrieval algorithm for Electron Ptychography from 4-dimensional (4-D) Scanning Transmission Electron Mi…

eess.IV2024

Compressive Electron Backscatter Diffraction Imaging

Zoë Broad, Alex W. Robinson, Jack Wells +4

Electron backscatter diffraction (EBSD) has developed over the last few decades into a valuable crystallographic characterisation method for a wide range of sample types. Despite t…

cond-mat.mtrl-sci20241 cited

Diffusion Distribution Model for Damage Mitigation in Scanning Transmission Electron Microscopy

Amirafshar Moshtaghpour, Abner Velazco-Torrejon, Daniel Nicholls +3

Despite the widespread use of Scanning Transmission Electron Microscopy (STEM) for observing the structure of materials at the atomic scale, a detailed understanding of some releva…

eess.SP2023

Proceedings of the first edition of the International Symposium on Computational Sensing (ISCS23)

Thomas Feuillen, Amirafshar Moshtaghpour

The International Symposium on Computational Sensing (ISCS) brings together researchers from optical microscopy, electron microscopy, RADAR, astronomical imaging, biomedical imagin…

eess.SP20232 cited

Subsampling Methods for Fast Electron Backscattered Diffraction Analysis

Zoë Broad, Daniel Nicholls, Jack Wells +5

Despite advancements in electron backscatter diffraction (EBSD) detector speeds, the acquisition rates of 4-Dimensional (4D) EBSD data, i.e., a collection of 2-dimensional (2D) dif…

physics.comp-ph2023

Scan Coil Dynamics Simulation for Subsampled Scanning Transmission Electron Microscopy

Daniel Nicholls, Jack Wells, Alex W. Robinson +3

Subsampling and fast scanning in the scanning transmission electron microscope is problematic due to scan coil hysteresis - the mismatch between the actual and assumed location of…