3 papers
physics.ins-det2017
Optically Coupled Methods for Microwave Impedance Microscopy
Scott R. Johnston, Eric Yue Ma, Zhi-Xun Shen
Scanning Microwave Impedance Microscopy (MIM) measurement of photoconductivity with 50 nm resolution is demonstrated using a modulated optical source. The use of a modulated source…
cond-mat.mtrl-sci2017
Measurement of Surface Acoustic Wave Resonances in Ferroelectric Domains by Microwave Microscopy
Scott R. Johnston, Yongliang Yang, Yong-Tao Cui +7
Surface Acoustic Wave (SAW) resonances were imaged within a closed domain in the ferroelectric LiTaO via scanning Microwave Impedance Microscopy (MIM). The MIM probe is used fo…
cond-mat.mtrl-sci2016
Picosecond electric-field-induced threshold switching in phase-change materials
Peter Zalden, Michael J. Shu, Frank Chen +16
Many chalcogenide glasses undergo a breakdown in electronic resistance above a critical field strength. Known as threshold switching, this mechanism enables field-induced crystalli…