activity
20172023
most citedStorage and Caching: Synthesis of Flow-based Microfluidic Biochips

40 citations · 240 across the 22 of their papers we have counts for

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Showing cs.ARShow all

15 papers · 1 filter

cs.AR20223 cited

CorrectNet: Robustness Enhancement of Analog In-Memory Computing for Neural Networks by Error Suppression and Compensation

Amro Eldebiky, Grace Li Zhang, Georg Boecherer +2

The last decade has witnessed the breakthrough of deep neural networks (DNNs) in many fields. With the increasing depth of DNNs, hundreds of millions of multiply-and-accumulate (MA…

cs.AR2022

VirtualSync+: Timing Optimization with Virtual Synchronization

Grace Li Zhang, Bing Li, Xing Huang +4

In digital circuit designs, sequential components such as flip-flops are used to synchronize signal propagations. Logic computations are aligned at and thus isolated by flip-flop s…

cs.AR201722 cited

Design-Phase Buffer Allocation for Post-Silicon Clock Binning by Iterative Learning

Li Zhang, Bing Li, Jinglan Liu +2

At submicron manufacturing technology nodes, pro- cess variations affect circuit performance significantly. To counter these variations, engineers are reserving more timing margin…

cs.AR201718 cited

PieceTimer: A Holistic Timing Analysis Framework Considering Setup/Hold Time Interdependency Using A Piecewise Model

Grace Li Zhang, Bing Li, Ulf Schlichtmann

In static timing analysis, clock-to-q delays of flip-flops are considered as constants. Setup times and hold times are characterized separately and also used as constants. The char…

cs.AR201721 cited

EffiTest: Efficient Delay Test and Statistical Prediction for Configuring Post-silicon Tunable Buffers

Grace Li Zhang, Bing Li, Ulf Schlichtmann

At nanometer manufacturing technology nodes, process variations significantly affect circuit performance. To combat them, post- silicon clock tuning buffers can be deployed to bala…

cs.AR201718 cited

Sampling-based Buffer Insertion for Post-Silicon Yield Improvement under Process Variability

Grace Li Zhang, Bing Li, Ulf Schlichtmann

At submicron manufacturing technology nodes process variations affect circuit performance significantly. This trend leads to a large timing margin and thus overdesign to maintain y…