collaborators

1 paper

physics.ins-det2017

Atomic Layer deposition of 2D and 3D standards for quantitative synchrotron-based composition and structural analysis methods

Nicholas G. Becker, Anna Butterworth, Andrey Sokolov +5

The use of Standard Reference Materials (SRM) from the National Institute of Standards and Technology (NIST) for quantitative analysis of chemical composition using Synchrotron bas…