76 citations · 141 across the 3 of their papers we have counts for
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cond-mat.mtrl-sci2017★ 1 cited
Passivation of dangling bonds on hydrogenated Si(100)-21: a possible method for error correction in hydrogen lithography
Niko Pavliček, Zsolt Majzik, Gerhard Meyer +1
Using combined low temperature scanning tunneling microscopy (STM) and atomic force microscopy (AFM), we demonstrate hydrogen passivation of individual, selected dangling bonds (DB…
cond-mat.mtrl-sci2013★ 76 cited
Combined AFM and STM measurements of a silicene sheet grown on Ag(111) surface
Zsolt Majzik, Mohamed Rachid Tchalala, Martin Švec +7
In this Letter, we present the first non-contact atomic force microscopy (nc-AFM) of a silicene on silver (Ag) surface, obtained by combining non-contact atomic force microscopy (n…