31 citations · 31 across the 2 of their papers we have counts for
3 papers
Mapping Charge Recombination and the Effect of Point Defect Insertion in Gallium Arsenide Nanowire Heterojunctions
Brian Zutter, Hyunseok Kim, William Hubbard +4
Electronic devices are extremely sensitive to defects in their constituent semiconductors, but locating electronic point defects in bulk semiconductors has previously been impossib…
Differential electron yield imaging with STXM
William A. Hubbard, Jared J. Lodico, Xin Yi Ling +4
Total electron yield (TEY) imaging is an established scanning transmission X-ray microscopy (STXM) technique that gives varying contrast based on a sample's geometry, elemental com…
Thermometry of Silicon Nanoparticles
Matthew Mecklenburg, Brian Zutter, B. C. Regan
Current thermometry techniques lack the spatial resolution required to see the temperature gradients in typical, highly-scaled modern transistors. As a step toward addressing this…