79 citations · 203 across the 7 of their papers we have counts for
7 papers
Giant enhancement of attosecond tunnel ionization competes with disorder-driven decoherence in silicon
D. N. Purschke, D. Vick, A. Cárdenas +16
High-harmonic generation (HHG) is a strong-field phenomenon that is sensitive to the attosecond dynamics of tunnel ionization and coherent transport of electron-hole pairs in solid…
Atomic White-Out: Enabling Atomic Circuitry Through Mechanically Induced Bonding of Single Hydrogen Atoms to a Silicon Surface
Taleana Huff, Hatem Labidi, Mohammad Rashidi +4
We report the mechanically induced formation of a silicon-hydrogen covalent bond and its application in engineering nanoelectronic devices. We show that using the tip of a non-cont…
New fabrication technique for highly sensitive qPlus sensor with well-defined spring constant
Hatem Labidi, Martin Kupsta, Taleana Huff +5
A new technique for the fabrication of highly sensitive qPlus sensor for atomic force microscopy (AFM) is described. Focused ion beam was used to cut then weld onto a bare quartz t…
Scanning tunneling spectroscopy reveals a silicon dangling bond charge state transition
Hatem Labidi, Marco Taucer, Mohammad Rashidi +6
We report the study of single dangling bonds (DB) on the hydrogen terminated silicon (100) surface using a low temperature scanning tunneling microscope (LT-STM). By investigating…
Silicon Atomic Quantum Dots Enable Beyond-CMOS Electronics
Robert A. Wolkow, Lucian Livadaru, Jason Pitters +5
We review our recent efforts in building atom-scale quantum-dot cellular automata circuits on a silicon surface. Our building block consists of silicon dangling bond on a H-Si(001)…
Nanoscale structuring of tungsten tip yields most coherent electron point-source
Josh Y. Mutus, Lucian Livadaru, Radovan Urban +3
This report demonstrates the most spatially-coherent electron source ever reported. A coherence angle of 14.3 +/- 0.5 degrees was measured, indicating a virtual source size of 1.7…
Low Energy Electron Point Projection Microscopy of Suspended Graphene, the Ultimate "Microscope Slide"
J. Y. Mutus, L. Livadaru, J. T. Robinson +5
Point Projection Microscopy (PPM) is used to image suspended graphene using low-energy electrons (100-200eV). Because of the low energies used, the graphene is neither damaged or c…