Theory and particle tracking simulations of a resonant radiofrequency deflection cavity in TM${}_{110}$ mode for ultrafast electron microscopy

J. F. M. van Rens, W. Verhoeven, J. G. H. Franssen +5

We present a theoretical description of resonant radiofrequency (RF) deflecting cavities in TM${}_{110}$ mode as dynamic optical elements for ultrafast electron microscopy. We first…