most citedssEMnet: Serial-section Electron Microscopy Image Registration using a Spatial Transformer Network with Learned Features

70 citations · 70 across the 1 of their papers we have counts for

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1 paper

cs.CV2017★ 70 cited

ssEMnet: Serial-section Electron Microscopy Image Registration using a Spatial Transformer Network with Learned Features

Inwan Yoo, David G. C. Hildebrand, Willie F. Tobin +2

The alignment of serial-section electron microscopy (ssEM) images is critical for efforts in neuroscience that seek to reconstruct neuronal circuits. However, each ssEM plane conta…