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most citedEvidence of giant oscillator strength in the exciton dephasing of CdSe nanoplatelets measured by resonant four-wave mixing

189 citations · 527 across the 13 of their papers we have counts for

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cond-mat.mtrl-sci2022★ 4 cited

Low-energy electron microscopy intensity-voltage data -- factorization, sparse sampling, and classification

Francesco Masia, Wolfgang Langbein, Simon Fischer +2

Low-energy electron microscopy (LEEM) taken as intensity-voltage (I-V) curves provides hyperspectral images of surfaces, which can be used to identify the surface type, but are dif…