110 citations · 562 across the 36 of their papers we have counts for
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cond-mat.mtrl-sci2016★ 24 cited
Realistic inversion of diffraction data for an amorphous solid: the case of amorphous silicon
Anup Pandey, Parthapratim Biswas, Bishal Bhattarai +1
We apply a new method "force enhanced atomic refinement" (FEAR) to create a computer model of amorphous silicon (a-Si), based upon the highly precise X-ray diffraction experiments…
cond-mat.mtrl-sci2016
Inversion of diffraction data for amorphous materials
Anup Pandey, Parthapratim Biswas, David A. Drabold
The general and practical inversion of diffraction data-producing a computer model correctly representing the material explored - is an important unsolved problem for disordered ma…