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physics.app-ph2025
A duality between surface charge and work function in scanning Kelvin probe microscopy
Isaac C. D. Lenton, Felix Pertl, Lubuna Shafeek +1
Scanning Kelvin probe microscopy (SKPM) is a powerful technique for macroscopic imaging of the electrostatic potential above a surface. Though most often used to image work-functio…
physics.app-ph2024★ 4 cited
Beyond the blur: using experimentally determined point spread functions to improve scanning Kelvin probe imaging
Isaac C. D. Lenton, Felix Pertl, Lubuna Shafeek +1
Scanning Kelvin probe microscopy (SKPM) is a powerful technique for investigating the electrostatic properties of material surfaces, enabling the imaging of variations in work func…