Decoherence in a single trapped ion due to engineered reservoir

Abstract

The decoherence in trapped ion induced by coupling the ion to the engineered reservoir is studied in this paper. The engineered reservoir is simulated by random variations in the trap frequency, and the trapped ion is treated as a two-level system driven by a far off-resonant plane wave laser field. The dependence of the decoherence rate on the amplitude of the superposition state is given.

4 pages, 2 figures

References in corpus (3)

• Decoherence in ion traps due to laser intensity and phase fluctuations
• Decoherence and fidelity in ion traps with fluctuating trap parameters
• Nonlinear Decoherence in Quantum State Preparation of a Trapped Ion

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