A High Efficiency Ultra High Vacuum Compatible Flat Field Spectrometer for EUV Wavelengths

Abstract

A custom, flat field, extreme ultraviolet EUV spectrometer built specifically for use with low power light sources that operate under ultrahigh vacuum conditions is reported. The spectral range of the spectrometer extends from 4 nm to 40 nm. The instrument optimizes the light gathering power and signal to noise ratio while achieving good resolution. A detailed description of the spectrometer and design considerations are presented, as well as a novel procedure that could be used to obtain a synthetic wavelength calibration with the aid of only a single known spectral feature. This synthetic wavelength calibration is compared to a standard wavelength calibration obtained from previously reported spectral lines of Xe, Ar and Ne ions recorded with this spectrometer.

Cited by in corpus (7)

• EUV spectra of highly-charged ions W${}^{54+}$-W${}^{63+}$ relevant to ITER diagnostics
• Spectroscopy of diagnostically-important magnetic-dipole lines in highly-charged 3d${}^n$ ions of tungsten
• Spectra of W${}^{39+}$-W${}^{47+}$ in the 12 nm to 20 nm region observed with an EBIT light source
• EUV magnetic-dipole lines from highly-charged high-Z ions with an open 3d shell
• Measurements and identifications of extreme ultraviolet spectra of highly-charged Sm and Er
• Measuring the Variation in Nuclear Charge Radius of Xe Isotopes by EUV Spectroscopy of Highly-Charged Na-like Ions
• Anisotropic LMN dielectronic resonances from ratios of magnetic-dipole lines