Scanned Potential Microscopy of Edge States in a Quantum Hall Liquid
arXiv:cond-mat/9911358 · doi:10.1016/S1386-9477(99)00115-0
Abstract
Using a low-temperature atomic force microscope as a local voltmeter, we measure the Hall voltage profile in a quantum Hall conductor in the presence of a gate-induced non-equilibrium edge state population at n=3. We observe sharp voltage drops at the sample edges which are suppressed by re-equilibrating the edge states.
4 pages, 4 figs. To be published in Physica E (Proceedings of the 13th International Conference on the Properties of 2D Systems)
References in corpus (2)
Cited by in corpus (3)
- Imaging Inter-Edge State Scattering Centers in the Quantum Hall Regime
- Cryogenic scanning force microscopy of quantum Hall samples: Adiabatic transport originating in anisotropic depletion at contact interfaces
- Low Temperature Electrostatic Force Microscopy of a Deep Two Dimensional Electron Gas using a Quartz Tuning Fork