Interfacial Energy and Fine Defect Structures for Incoherent Films
arXiv:cond-mat/9910360
Abstract
This note summarizes recent results in which modern techniques of the calculus of variations are used to obtain qualitative features of film-substrate interfaces for a broad class of interfacial energies. In particular, we show that the existence of a critical thickness for incoherency and the formation of interfacial dislocations depend strongly on the convexity and smoothness of the interfacial energy function.
4 pages