Dephasing in semiconductor-superconductor structures by coupling to a voltage probe
arXiv:cond-mat/9909029 · doi:10.1006/spmi.2000.0890
Abstract
We study dephasing in semiconductor-superconductor structures caused by coupling to a voltage probe. We consider structures where the semiconductor consists of two scattering regions between which partial dephasing is possible. As a particular example we consider a situation with a double-barrier junction in the normal region. For a single-mode system we study the conductance both as a function of the position of the Fermi level and as a function of the barrier transparency. At resonance, where the double-barrier is fully transparent, we study the suppression of the ideal factor-of-two enhancement of the conductance when a finite coupling to the voltage probe is taken into account.
13 pages including 3 figures. Accepted for publication in Superlattices and Microstructures
References in corpus (4)
- Random-Matrix Theory of Quantum Transport
- Angle dependence of Andreev scattering at semiconductor-superconductor interfaces
- Distribution functions and current-correlations in normal-metal--superconductor hetero-structures
- Conductance enhancement in quantum point contact-semiconductor-superconductor devices
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- Tunneling in partial coherence through a series of barriers: an explicit result from a pure dephasing model
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- A comparative study of some models of incoherence at the mesoscopic scale
- Side-gate modulation of critical current in mesoscopic Josephson junction