On the reorientation transition of ultra-thin Ni/Cu(001) films
arXiv:cond-mat/9812421 · doi:10.1016/S0304-8853(98)01200-1
Abstract
The reorientation transition of the magnetization of ferromagnetic films is studied on a microscopic basis within a Heisenberg spin model. Using a modified mean field formulation it is possible to calculate properties of magnetic thin films with non-integer thicknesses. This is especially important for the reorientation transition in Ni/Cu(001), as there the magnetic properties are a sensitive function of the film thickness. Detailed phase diagrams in the thickness-temperature plane are calculated using experimental parameters and are compared with experimental measurements by Baberschke and Farle (J. Appl. Phys. 81, 5038 (1997)).
7 pages(LaTeX2e) with one figure(eps), accepted for publication in JMMM. See also http://www.thp.Uni-Duisburg.DE/Publikationen/Publist_Us_R.html