Frequency-Dependent Shot Noise as a Probe of Electron-Electron Interaction in Mesoscopic Diffusive Contacts

Abstract

The frequency-dependent shot noise in long and narrow mesoscopic diffusive contacts is numerically calculated. The case of arbitrarily strong electron-electron scattering and zero temperature of electrodes is considered. For all voltages, the noise increases with frequency and tends to finite values. These limiting values are larger than the Poissonian noise and increase nearly as voltage to power 4/3. This allows one to experimentally determine the parameters of electron-electron interaction.

3 pages, RevTeX, 3 eps figures

References in corpus (2)

• Long-Range Coulomb Interaction and Frequency Dependence of Shot Noise in Mesoscopic Diffusive Contacts
• Effect of screening on shot noise in diffusive mesoscopic conductors

Cited by in corpus (3)

• Current noise in long diffusive SNS junctions in the incoherent MAR regime
• Microscopic analysis of shot-noise suppression in nondegenerate diffusive conductors
• Nonlinear voltage dependence of the shot noise in mesoscopic degenerate conductors with strong electron-electron scattering