Critical wetting of a class of nonequilibrium interfaces: A mean-field picture
arXiv:cond-mat/0703403 · doi:10.1103/PhysRevE.75.031105
Abstract
A self-consistent mean-field method is used to study critical wetting transitions under nonequilibrium conditions by analyzing Kardar-Parisi-Zhang (KPZ) interfaces in the presence of a bounding substrate. In the case of positive KPZ nonlinearity a single (Gaussian) regime is found. On the contrary, interfaces corresponding to negative nonlinearities lead to three different regimes of critical behavior for the surface order-parameter: (i) a trivial Gaussian regime, (ii) a weak-fluctuation regime with a trivially located critical point and nontrivial exponents, and (iii) a highly non-trivial strong-fluctuation regime, for which we provide a full solution by finding the zeros of parabolic-cylinder functions. These analytical results are also verified by solving numerically the self-consistent equation in each case. Analogies with and differences from equilibrium critical wetting as well as nonequilibrium complete wetting are also discussed.
11 pages, 2 figures