Thermal expansion of Josephson junctions as an elastic response to an effective stress field
arXiv:cond-mat/0701459 · doi:10.1103/PhysRevB.75.014506
Abstract
By introducing a concept of thermal expansion (TE) of a Josephson junction as an elastic response to an effective stress field, we study (both analytically and numerically) the temperature and magnetic field dependence of TE coefficient in a single small junction and in a square array. In particular, we found that in addition to {\it field} oscillations due to Fraunhofer-like dependence of the critical current, of a small single junction also exhibits strong flux driven {\it temperature} oscillations near . We also numerically simulated stress induced response of a closed loop with finite self-inductance (a prototype of an array) and found that of a array may still exhibit temperature oscillations provided the applied magnetic field is strong enough to compensate for the screening induced effects.
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Cited by in corpus (3)
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- Manifestation of geometric resonance in current dependence of AC susceptibility for unshunted array of Nb-AlOx-Nb Josephson junctions
- Novel magnetoinductance effects in Josephson Junction Arrays: A single-plaquette approximation