Probing quantum-mechanical level repulsion in disordered systems by means of time-resolved selectively-excited resonance fluorescence
arXiv:cond-mat/0701406 · doi:10.1103/PhysRevLett.98.087401
Abstract
We argue that the time-resolved spectrum of selectively-excited resonance fluorescence at low temperature provides a tool for probing the quantum-mechanical level repulsion in the Lifshits tail of the electronic density of states in a wide variety of disordered materials. The technique, based on detecting the fast growth of a fluorescence peak that is red-shifted relative to the excitation frequency, is demonstrated explicitly by simulations on linear Frenkel exciton chains.
4 pages, 4 figures, to appear in Phys. Rev. Lett