Microscopic and Macroscopic Signatures of Antiferromagnetic Domain Walls

Abstract

Magnetotransport measurements on small single crystals of Cr, the elemental antiferromagnet, reveal the hysteretic thermodynamics of the domain structure. The temperature dependence of the transport coefficients is directly correlated with the real-space evolution of the domain configuration as recorded by x-ray microprobe imaging, revealing the effect of antiferromagnetic domain walls on electron transport. A single antiferromagnetic domain wall interface resistance is deduced to be of order $5\times 10^{-5}\mu \mathrm{\Omega }\cdot \mathrm{c}{\mathrm{m}}^2$ at a temperature of 100 K.

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References in corpus (4)

• Stable ultrahigh-density magneto-optical recordings using introduced linear defects
• X-ray Microdiffraction Images of Antiferromagnetic Domain Evolution in Chromium
• Quasistatic x-ray speckle metrology of microscopic magnetic return point memory
• Resistance of a domain wall in the quasiclassical approach

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