Electronic and optical properties of beryllium chalcogenides/silicon heterostructures

Titus Sandu W. P. Kirk

doi:10.1103/PhysRevB.73.235307

paper

Electronic and optical properties of beryllium chalcogenides/silicon heterostructures

arXiv:cond-mat/0608514 · doi:10.1103/PhysRevB.73.235307

Abstract

We have calculated electronic and optical properties of Si/BeSe $_{0.41}$ Te $_{0.59}$ heterostructures by a semiempirical $s p^{3} s^{*}$ tight-binding method. Tight-binding parameters and band bowing of BeSe $_{0.41}$ Te $_{0.59}$ are considered through a recent model for highly mismatched semiconductor alloys. The band bowing and the measurements of conduction band offset lead to a type II heterostucture for Si/BeSe $_{0.41}$ Te $_{0.59}$ with conduction band minimum in the Si layer and valence band maximum in the BeSe $_{0.41}$ Te $_{0.59}$ layer. The electronic structure and optical properties of various (Si $_{2})_{n}$ /(BeSe $_{0.41}$ Te $_{0.59})_{m}$ [001] superlattices have been considered. Two bands of interface states were found within the bandgap of bulk Si. Our calculations indicate that the optical edges are below the fundamental bandgap of bulk Si and the transitions are optically allowed.

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