Dynamic critical behaviors in two-dimensional Josephson junction arrays with positional disorder

Abstract

We numerically investigate dynamic critical behaviors of two-dimensional (2D) Josephson-junction arrays with positional disorder in the scheme of the resistively shunted junction dynamics. Large-scale computation of the current voltage characteristics reveals an evidence supporting that a phase transition occurs at a nonzero critical temperature in the strong disorder regime, as well as in the weak disorder regime. The phase transition at weak disorder appears to belong to the Berezinskii-Kosterlitz-Thouless (BKT) type. In contrast, evidence for a non-BKT transition is found in the strong disorder regime. These results are consistent with the recent experiment %by Yun {\it et al.} in cond-mat/0509151 on positionally disordered Josephson-junction arrays; in particular, the critical temperature of the non-BKT transition (ranging from 0.265 down to the minimum 0.22 in units of $E_J/k_B$ with the Josephson coupling strength $E_J$), the correlation length critical exponent $\nu =1.2$, and the dynamic critical exponent $z=2.0$ in the strong disorder regime agree with the existing studies of the 2D gauge-glass model.

Phys. Rev. B (in press)

References in corpus (5)

• Numerical studies of the two- and three-dimensional gauge glass at low temperature
• On the existence of a finite-temperature transition in the two-dimensional gauge glass
• Phase Transitions in the Two-Dimensional Random Gauge XY Model
• Critical properties of the three- and four-dimensional gauge glass
• Zero Temperature Glass Transition in the Two-Dimensional Gauge Glass Model

Cited by in corpus (3)

• Curvature-induced frustration in the $XY$ model on hyperbolic surfaces
• Phase transition in site-diluted Josephson junction arrays: A numerical study
• Dynamics of glass phases in the two-dimensional gauge glass model