Propagation of edge magnetoplasmons in semiconductor quantum-well structures
arXiv:cond-mat/0607267 · doi:10.1063/1.2236866
Abstract
The wavelength and the propagation length of the edge magnetoplasmons, running along the edge of a two-dimensional electron layer in a semiconductor quantum-well structure are theoretically studied as a function of frequency, magnetic field, electron density, mobility, and geometry of the structure. The results are intended to be used for analysis and optimization of operation of recently invented quantum-well microwave spectrometers operating at liquid-nitrogen temperatures (I. V. Kukushkin {\em et al}, Appl. Phys. Lett. {\bf 86}, 044101 (2005)).
4 pages, including 4 figures. Accepted for publication in Appl. Phys. Lett