Universal Scaling in Mixing Correlated Growth with Randomness
arXiv:cond-mat/0509668 · doi:10.1103/PhysRevE.73.011603
Abstract
We study two-component growth that mixes random deposition (RD) with a correlated growth process that occurs with probability p. We find that these composite systems are in the universality class of the correlated growth process. For RD blends with either Edwards-Wilkinson of Kardar-Parisi-Zhang processes, we identify a nonuniversal parameter in the universal scaling in p.
4 pages, 6 figures, 11 references; under review
References in corpus (6)
- Phase ordering and roughening on growing films
- Crossover effects in a discrete deposition model with Kardar-Parisi-Zhang scaling
- Scaling in the two-component surface growth
- Roughening of the (1+1) interfaces in two-component surface growth with an admixture of random deposition
- Dynamic transition in deposition with a poisoning species
- Kinetic roughening model with opposite Kardar-Parisi-Zhang nonlinearities
Cited by in corpus (9)
- Universal and nonuniversal features in the crossover from linear to nonlinear interface growth
- Parameter free scaling relation for nonequilibrium growth processes
- Characterisation of non-equilibrium growth through global two-time quantities
- Solid on Solid Model for Surface Growth in 2+1 Dimensions
- Nonuniversal effects in mixing correlated-growth processes with randomness: Interplay between bulk morphology and surface roughening
- Surface and bulk properties of ballistic deposition models with bond breaking
- New method to study stochastic growth equations: a cellular automata perspective
- Crossover of interface growth dynamics during corrosion and passivation
- Comment on "Dynamic properties in a family of competitive growing models"