Polarized resonant inelastic x-ray scattering as an ultra-fine probe of excited states in La2CuO4

Abstract

X-ray absorption is the standard method to probe the unoccupied density of states at a given edge. Here we show that polarized Resonant Inelastic X-Ray Scattering in La2CuO4 at the Cu K-edge is extremely sensitive to the environment of the Cu atom and the fine structure in the Cu 4p density of states. Combined ab initio and many-body cluster calculations, used for the first time in such a context, show remarkable agreement with experiment. In particular we identify a non-local effect namely a transition to off-site Cu 3d states.

arXiv comment4 pages, 4 pictures

References in corpus (3)

• Phonons and related properties of extended systems from density-functional perturbation theory
• A linear response approach to the calculation of the effective interaction parameters in the LDA+U method
• Doping dependence of charge-transfer excitations in La_{2-x}Sr_xCuO_4

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• Proposal for detecting spin-chirality terms in Mott insulators via resonant inelastic x-ray scattering
• Two-magnon excitations in resonant inelastic x-ray scattering studied by spin-density-wave formalism
• Multiple pre-edge structures in Cu K-edge of high Tc cuprates revealed by high resolution x-ray absorption spectroscopy
• Analysis of Resonant Inelastic X-Ray Scattering in Stripe-Ordered Nickelate