Resonant inelastic X-ray scattering study of overdoped La${}_{2-x}$Sr${}_x$CuO${}_4$

Abstract

Resonant inelastic x-ray scattering (RIXS) at the copper K absorption edge has been performed for heavily overdoped samples of La${}_{2-x}$Sr${}_x$CuO${}_4$ with $x=0.25$ and 0.30. We have observed the charge transfer and molecular-orbital excitations which exhibit resonances at incident energies of $E_i=8.992$ and 8.998 keV, respectively. From a comparison with previous results on undoped and optimally-doped samples, we determine that the charge-transfer excitation energy increases monotonically as doping increases. In addition, the $E_i$-dependences of the RIXS spectral weight and absorption spectrum exhibit no clear peak at $E_i=8.998$ keV in contrast to results in the underdoped samples. The low-energy ($\le 3$ eV) continuum excitation intensity has been studied utilizing the high energy resolution of 0.13 eV (FWHM). A comparison of the RIXS profiles at $(\pi 0)$ and $(\pi \pi )$ indicates that the continuum intensity exists even at $(\pi \pi )$ in the overdoped samples, whereas it has been reported only at $(00)$ and $(\pi 0)$ for the $x=0.17$ sample. Furthermore, we also found an additional excitation on top of the continuum intensity at the $(\pi \pi )$ and $(\pi 0)$ positions.

arXiv comment7 pages, 7 figures

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• Momentum Dependent Charge Excitations of Two-Leg Ladder: Resonant Inelastic X-ray Scattering of (La,Sr,Ca)14Cu24O41
• Bulk Fermi surface and momentum density in heavily doped La${}_{2-x}$Sr${}_x$CuO${}_4$ using high resolution Compton scattering and positron annihilation spectroscopies
• Electronic Structure of Doped Lanthanum Cuprates Studied with Resonant Inelastic X-Ray Scattering
• Resonant inelastic X-ray scattering study of intra-band charge excitations in hole-doped high-Tc cuprates