Soft X-ray Resonant Magnetic Scattering Studies on Fe/CoO Exchange Bias System

Abstract

We have used soft X-ray Resonant Magnetic Scattering (XRMS) to search for the presence of an effective ferromagnetic moment belonging to the antiferromagnetic (AF) layer which is in close contact with a ferromagnetic (F) layer. Taking advantage of the element specificity of the XRMS technique, we have measured hysteresis loops of both Fe and CoO layers of a CoO(40 Å)/Fe(150 Å) exchange bias bilayer. From these measurements we have concluded that the proximity of the F layer induces a magnetic moment in the AF layer. The F moment of the AF layer has two components: one is frozen and does not follow the applied magnetic field and the other one follows in phase the ferromagnetic magnetization of the F layer. The temperature dependence of the F components belonging to the AF layer is shown and discussed.

arXiv comment5 pages, 4 figures, submitted to J. Magn. Magn. Mater

References in corpus (2)

• Positive and Perpendicular Exchange Bias CoO/Co Bilayers
• Ferromagnetic Domain Distribution in Thin Films During Magnetization Reversal

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