paper

Two dimensional scaling of resistance in flux flow region in thin films

arXiv:cond-mat/0412069 · doi:10.1016/j.physc.2004.08.011

Abstract

The resistance of thin films has been measured when the angle between the applied fields and -plane of the film is changed continuously at various temperatures. Under various magnetic fields, the resistance can be well scaled in terms of the c-axis component of the applied fields at the same temperature in the whole angle range. Meanwhile, we show that the measurement of resistance in this way is a complementary method to determine the growth orientation of the anisotropic high- superconductors.

11 pages, 8 figures. Have been published in Physica C