Random Deposition Model with a Constant Capture Length
arXiv:cond-mat/0409048 · doi:10.1143/PTP.113.15
Abstract
We introduce a sequential model for the deposition and aggregation of particles in the submonolayer regime. Once a particle has been randomly deposited on the substrate, it sticks to the closest atom or island within a distance \ell, otherwise it sticks to the deposition site. We study this model both numerically and analytically in one dimension. A clear comprehension of its statistical properties is provided, thanks to capture equations and to the analysis of the island-island distance distribution.
14 pages, minor corrections. Accepted for publication in Progress of Theoretical Physics