Memory of multiple aging stages above the freezing temperature in the relaxor ferroelectric PLZT
arXiv:cond-mat/0312297 · doi:10.1103/PhysRevLett.93.097601
Abstract
The dynamic dielectric susceptibility and elastic compliance of the relaxor ferroelectric PLZT 9/65/35 have been measured under different cooling and heating protocols, in order to study aging and memory. The memory of multiple aging stages has been found (several dips in the susceptibility curves on heating), as in spin glass systems below the glass transition. Remarkably, in PLZT the memory is retained also above the freezing temperature deduced from the dynamic susceptibilities. The results are discussed in the light of the existing models of aging and memory in spin and dipolar glasses.
Improved version accepted by Phys. Rev. Lett
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