A Model for Striped Growth
arXiv:cond-mat/0307715 · doi:10.1103/PhysRevE.69.011104
Abstract
We introduce a model for describing the defected growth of striped patterns. This model, while roughly related to the Swift-Hohenberg model, generates a quite different mixture of defects during phase ordering. We find two characteristic lengths in the system: the scaling length L(t), and the average width of the domain walls. The growth law exponent is larger than the value of 1/2 found in typical point defect systems.
arXiv comment7 pages, 14 figures
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