Self-organized criticality in the Bean state in YBa$_2$Cu$_3$O$_{7-x}$ thin films

C. M. Aegerter; M. S. Welling; R. J. Wijngaarden

paper

Self-organized criticality in the Bean state in YBa $_{2}$ Cu $_{3}$ O $_{7 - x}$ thin films

arXiv:cond-mat/0305591

Abstract

The penetration of magnetic flux into a thin film of YBa $_{2}$ Cu $_{3}$ O $_{7 - x}$ is studied when the external field is ramped slowly. In this case the flux penetrates in bursts or avalanches. The size of these avalanches is distributed according to a power law with an exponent of $τ$ = 1.29(2). The additional observation of finite-size scaling of the avalanche distributions, with an avalanche dimension D = 1.89(3), gives strong indications towards self-organized criticality in this system. Furthermore we determine exponents governing the roughening dynamics of the flux surface using some universal scaling relations. These exponents are compared to those obtained from a standard roughening analysis.

4 pages, 4 figures, submitted to PRL

Self-organized criticality in the Bean state in YBa2​Cu3​O7−x​ thin films

Abstract

Self-organized criticality in the Bean state in YBa $_{2}$ Cu $_{3}$ O $_{7 - x}$ thin films