Probe-configuration dependent dephasing in a mesoscopic interferometer
arXiv:cond-mat/0304022 · doi:10.1103/PhysRevB.68.161310
Abstract
Dephasing in a ballistic four-terminal Aharonov-Bohm geometry due to charge and voltage fluctuations is investigated. Treating two terminals as voltage probes, we find a strong dependence of the dephasing rate on the probe configuration in agreement with a recent experiment by Kobayashi et al. (J. Phys. Soc. Jpn. 71, 2094 (2002)). Voltage fluctuations in the measurement circuit are shown to be the source of the configuration dependence.
4 pages, 3 figures
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